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English: Testing standard interfaces for dimensional metrology equipment
日期
來源 NIST Programs of the Manufacturing Engineering Laboratory
作者 National Institute of Standards and Technology’s Manufacturing Engineering

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This work is in the public domain in the United States because it is a work prepared by an officer or employee of the United States Government as part of that person’s official duties under the terms of Title 17, Chapter 1, Section 105 of the US Code. Note: This only applies to original works of the Federal Government and not to the work of any individual U.S. state, territory, commonwealth, county, municipality, or any other subdivision. This template also does not apply to postage stamp designs published by the United States Postal Service since 1978. (See § 313.6(C)(1) of Compendium of U.S. Copyright Office Practices). It also does not apply to certain US coins; see The US Mint Terms of Use.

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3月 2008

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現時2009年8月4號 (二) 20:26響2009年8月4號 (二) 20:26嘅縮圖版本785 × 680(116 KB)Mdd== Summary == {{Information |Description={{en|1=Testing standard interfaces for dimensional metrology equipment}} |Source=[http://www.mel.nist.gov/programs/pbookweb.pdf NIST Programs of the Manufacturing Engineering Laboratory] |Author=National Institute

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